ALC’19
- WriterCenter for Artificial Low Dimensional Electronic Systems
- RegDate2019-10-24
- Hit746
- att.
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Atomic Level Characterization (ALC)' 19
□ Title of Conference :Atomic Level Characterization (ALC)' 19
□ Date : 2019-10-24
□ Country : Miyako Messe, Kyoto, Japan
□ Title of Paper(Presentation) : Atomic level characterization of domain walls in 1D and 2D electronic orders
□ Author and Presenter : H.W. Yeom